Watch the keynote presentation that highlights the extensive testing for the Orion spacecraft, including the ability to withstand 5000 degF heat generated from 25,000 mph re-entry into the Earth’s atmosphere.
Test & Measurement
Failure Analysis in Semiconductor Manufacturing
In a Semiconductor Engineering article, Pressure Builds On Failure Analysis Labs, Emerson’s Robert Manion and other industry professionals share their insights on the failure analysis before first silicon trend.
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Emerson Exchange 365
This blog features expert perspectives from Emerson's automation professionals on industry trends, technologies, and best practices. The information shared here is intended to inform and educate our global community of users and partners.